Showing results: 1441 - 1455 of 2458 items found.
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U2741A -
Keysight Technologies
The Keysight U2741A USB Modular Digital Multimeter provides a broad range of measurement functions, including temperature and frequency. The U2741A is a 5.5-digit resolution digital multimeter that is able to capture up to 100 readings/sec. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity allowing users to set up and configure their tests swiftly with its plug and play feature.
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Scientech Technologies Pvt. Ltd.
We are the leading supplier of IC Tester, Universal IC Tester, Linear IC Tester and handy Liner IC Tester like LP02, Nvis 9350T , Nvis 9351T and Nvis 9352T. Universal IC Tester can text a wide range of Digital IC’s such as 74 Series, 40/45 Series of CMOS IC’s. It can also test 7 segment display of common cathode & common anode type
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M8000 Series -
Keysight Technologies
Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
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PFX2500 Series -
Kikusui Electronics Corp.
PFX2500 Series is a high performance Charge/Discharge system controller that takes measurements in combination with our DC power supply and electronic load in order to evaluate test sample (electric storage elements such as secondary batteries) characteristics. It is also capable to perform evaluation test with high-performance, large capacity and wide range of rating with the combination of DC power supply and electronic load.Execution of the test is conducted by the exclusive application software. The test corresponds to long time continuous test and synchronization test with temperature chambers with the multiplexed protection performance. In addition, easy data editing is also capable with fulfilling graphic performance.
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8PK-4103IN -
Prokit's Industries Co., Ltd.
Digital high voltage insulation tester 5kV digital tester with 500V increments and high voltage warning alarm. Test voltages from 500V to 5kV in 500V increments. Measure insulation resistance to 300G. LCD display indicates test voltage, test duration and insulation resistance. Measures insulation test voltages up to 5kV and insulation test time. Insulation resistance, autoranging on all ranges. Automatic external live voltage warning. High voltage applied warning buzzer. Complete with built-in heavy duty carrying case, test leads and 8 type C batteries.
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STARS MATS -
HORIBA, Ltd.
STARS MATS is a Mileage Accumulation Test System application available with the STARS Automation platform for chassis dynamometer. The application provides test execution, equipment control, refueling, and vehicle state monitoring to perform long endurance test without the necessity of continuous staff presence. Its flexible design offers a wide range a customization, and it addresses the different testing requirements from manual to fully-automated operation.
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420001 -
Sper Scientific
When undertaking power installations, the 420001-insulation tester can provide special help to test wiring. This unit can provide 125V,250V, 500V and 1000V source for the test, and under each range it can supply 1mA current to feed the capacitance load. With the auto-range function, it can measure up to 4,000 Megaohm with the resolution of 1Kohm.
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Columbia Elektronik AB
As a Scandinavian pioneer in this area, In-Circuit-Test technology is at the heart of our mission. ICT is by far the most widely accepted test technology and Kontest has over the years contributed considerably in this field. Our range of ICT systems takes care of the most complex boards and come with extensive programming tools.
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ET4500 -
Martindale Electric Co. Ltd
The new ET4500 tester carries out all the tests needed to verify the safety of electrical installations in domestic, commercial and industrial wiring installations in accordance with the latest regulations.
can be used to carry out 3 wire earth testing and has on board memory to store and download all installation test results for documentation.
Everything about the new ET Series has been designed to save time and make testing easier.Fast, reliable high current and non-trip loop testing comes as standard together with a high level of input protection and a CAT IV safety rating .Supplied with a full range of accessories.
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S930702B -
Keysight Technologies
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930705B -
Keysight Technologies
S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930709B -
Keysight Technologies
S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930701B -
Keysight Technologies
S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930712B -
Keysight Technologies
S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930704B -
Keysight Technologies
S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
